@inproceedings{496257e014694a48b0c1154a2961d045,
title = "Prediction of crack growth in IC passivation layers",
keywords = "Conf.proc. > 3 pag",
author = "Y He and GQ Zhang and {van Gils}, MAJ and {van Silfhout}, RBR and {van Driel}, WD and LJ Ernst",
year = "2003",
language = "Undefined/Unknown",
isbn = "0-7803-7054-6",
publisher = "IEEE Society",
pages = "323--328",
editor = "LJ Ernst and GQ Zhang and R Dudek and {de Saint Leger}, O",
booktitle = "Thermal & mechanical simulation and experiments in microelectronics and microsystems",
note = "EuroSimE 2003 ; Conference date: 30-03-2003 Through 02-04-2003",
}