Prediction of crack growth in IC passivation layers

Y He, MAJ van Gils, WD van Driel, GQ Zhang, RBR van Silfhout, LJ Ernst

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	Undefined/Unknown
Pages (from-to)	2003-2009
Number of pages	7
Journal	Microelectronics Reliability
Volume	44
Publication status	Published - 2004

Keywords

@article{56c1596372b443eeab197f811333cf58,

title = "Prediction of crack growth in IC passivation layers",

keywords = "ZX CWTS JFIS < 1.00",

author = "Y He and {van Gils}, MAJ and {van Driel}, WD and GQ Zhang and {van Silfhout}, RBR and LJ Ernst",

year = "2004",

language = "Undefined/Unknown",

volume = "44",

pages = "2003--2009",

journal = "Microelectronics Reliability",

issn = "0026-2714",

publisher = "Elsevier",

}