Prioritizing Software Inspection Results using Static Profiling

C. Boogerd; LMF Moonen

Prioritizing Software Inspection Results using Static Profiling

C. Boogerd, LMF Moonen

Software Engineering

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

33 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	Proceedings of the Sixth IEEE International Workshop on Source Code Analysis and Manipulation (SCAM)
Editors	Massimilia Penta, Leon Moonen
Publisher	IEEE
Pages	149-158
Number of pages	10
Publication status	Published - 2006

Publication series

Name
Publisher	IEEE Computer Society Press

Bibliographical note

BM:SCAM06

Keywords

Conf.proc. > 3 pag

Cite this

@inproceedings{38667e0216084f74970874171f7b64a9,

title = "Prioritizing Software Inspection Results using Static Profiling",

keywords = "Conf.proc. > 3 pag",

author = "C. Boogerd and LMF Moonen",

note = "BM:SCAM06",

year = "2006",

language = "Undefined/Unknown",

publisher = "IEEE",

pages = "149--158",

editor = "Massimilia Penta and Leon Moonen",

booktitle = "Proceedings of the Sixth IEEE International Workshop on Source Code Analysis and Manipulation (SCAM)",

address = "United States",

}

Prioritizing Software Inspection Results using Static Profiling. / Boogerd, C.; Moonen, LMF.
Proceedings of the Sixth IEEE International Workshop on Source Code Analysis and Manipulation (SCAM). ed. / Massimilia Penta; Leon Moonen. IEEE, 2006. p. 149-158.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Prioritizing Software Inspection Results using Static Profiling

AU - Boogerd, C.

AU - Moonen, LMF

N1 - BM:SCAM06

PY - 2006

Y1 - 2006

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SP - 149

EP - 158

BT - Proceedings of the Sixth IEEE International Workshop on Source Code Analysis and Manipulation (SCAM)

A2 - Penta, Massimilia

A2 - Moonen, Leon

PB - IEEE

ER -