Raman spectroscopy characterization of residual stress in multicrystalline silicon solar wafers and solar cells: relation to microstructure, defects and processing conditions

V Popovich; JM Westra; RACMM van Swaaij; M Janssen; IJ Bennett; IM Richardson

doi:10.1109/PVSC.2011.6186276

Raman spectroscopy characterization of residual stress in multicrystalline silicon solar wafers and solar cells: relation to microstructure, defects and processing conditions

V Popovich, JM Westra, RACMM van Swaaij, M Janssen, IJ Bennett, IM Richardson

Photovoltaic Materials and Devices

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

5 Citations (Scopus)

Original language	English
Title of host publication	Proceedings 37th IEEE Photovoltaic Specialists Conference
Editors	D Wilt
Place of Publication	Piscataway, NJ, USA
Publisher	IEEE Society
Pages	1668-1673
Number of pages	6
DOIs	https://doi.org/10.1109/PVSC.2011.6186276
Publication status	Published - 2011
Event	37th IEEE Photovoltaic Specialists Conference - Seattle, United States Duration: 19 Jun 2011 → 24 Jun 2011 Conference number: 37

Publication series

Name
Publisher	IEEE

Conference

Conference	37th IEEE Photovoltaic Specialists Conference
Abbreviated title	PVSC 2011
Country/Territory	United States
City	Seattle
Period	19/06/11 → 24/06/11

Keywords

conference contrib. refereed
Conf.proc. > 3 pag

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

Access to Document

10.1109/PVSC.2011.6186276

Cite this

Popovich, V., Westra, JM., van Swaaij, RACMM., Janssen, M., Bennett, IJ., & Richardson, IM. (2011). Raman spectroscopy characterization of residual stress in multicrystalline silicon solar wafers and solar cells: relation to microstructure, defects and processing conditions. In D. Wilt (Ed.), Proceedings 37th IEEE Photovoltaic Specialists Conference (pp. 1668-1673). IEEE Society. https://doi.org/10.1109/PVSC.2011.6186276

@inproceedings{96ea5b2b09f04aa694abfc402c6569f3,

title = "Raman spectroscopy characterization of residual stress in multicrystalline silicon solar wafers and solar cells: relation to microstructure, defects and processing conditions",

keywords = "conference contrib. refereed, Conf.proc. > 3 pag",

author = "V Popovich and JM Westra and {van Swaaij}, RACMM and M Janssen and IJ Bennett and IM Richardson",

year = "2011",

doi = "10.1109/PVSC.2011.6186276",

language = "English",

publisher = "IEEE Society",

pages = "1668--1673",

editor = "D Wilt",

booktitle = "Proceedings 37th IEEE Photovoltaic Specialists Conference",

note = "37th IEEE Photovoltaic Specialists Conference, PVSC 2011 ; Conference date: 19-06-2011 Through 24-06-2011",

}

Popovich, V, Westra, JM, van Swaaij, RACMM , Janssen, M, Bennett, IJ & Richardson, IM 2011, Raman spectroscopy characterization of residual stress in multicrystalline silicon solar wafers and solar cells: relation to microstructure, defects and processing conditions. in D Wilt (ed.), Proceedings 37th IEEE Photovoltaic Specialists Conference. IEEE Society, Piscataway, NJ, USA, pp. 1668-1673, 37th IEEE Photovoltaic Specialists Conference, Seattle, United States, 19/06/11. https://doi.org/10.1109/PVSC.2011.6186276

Raman spectroscopy characterization of residual stress in multicrystalline silicon solar wafers and solar cells: relation to microstructure, defects and processing conditions. / Popovich, V; Westra, JM; van Swaaij, RACMM et al.
Proceedings 37th IEEE Photovoltaic Specialists Conference. ed. / D Wilt. Piscataway, NJ, USA: IEEE Society, 2011. p. 1668-1673.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Raman spectroscopy characterization of residual stress in multicrystalline silicon solar wafers and solar cells: relation to microstructure, defects and processing conditions

AU - Popovich, V

AU - Westra, JM

AU - van Swaaij, RACMM

AU - Janssen, M

AU - Bennett, IJ

AU - Richardson, IM

N1 - Conference code: 37

PY - 2011

Y1 - 2011

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

U2 - 10.1109/PVSC.2011.6186276

DO - 10.1109/PVSC.2011.6186276

M3 - Conference contribution

SP - 1668

EP - 1673

BT - Proceedings 37th IEEE Photovoltaic Specialists Conference

A2 - Wilt, D

PB - IEEE Society

CY - Piscataway, NJ, USA

T2 - 37th IEEE Photovoltaic Specialists Conference

Y2 - 19 June 2011 through 24 June 2011

ER -

Popovich V, Westra JM, van Swaaij RACMM , Janssen M, Bennett IJ, Richardson IM. Raman spectroscopy characterization of residual stress in multicrystalline silicon solar wafers and solar cells: relation to microstructure, defects and processing conditions. In Wilt D, editor, Proceedings 37th IEEE Photovoltaic Specialists Conference. Piscataway, NJ, USA: IEEE Society. 2011. p. 1668-1673 doi: 10.1109/PVSC.2011.6186276