DOI

Today's computer architectures and semiconductor technologies are facing major challenges making them incapable to deliver the required features (such as computer efficiency) for emerging applications. Alternative architectures are being under investigation in order to continue deliver sustainable benefits for the foreseeable future society at affordable cost. These architectures are not only changing the traditional computing paradigm (e.g., in terms of programming models, compilers, circuit design), but also setting up new challenges and directions on the way these architectures should be tested to guarantee the required quality and reliability levels. This paper highlights the major open questions regarding test and reliability of three emerging computing paradigms being approximate computing, computation-in-memory and neuromorphic computing.
Original languageEnglish
Title of host publication2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
PublisherIEEE
Pages1-6
Number of pages6
ISBN (Electronic)978-1-7281-2260-1
ISBN (Print)978-1-7281-2261-8
DOIs
Publication statusPublished - 2019

    Research areas

  • Alternative computing architectures, emerging technology, fault model, test, reliability

ID: 62457581