Standard

Reconstructing requirements coverage views from design and test using traceability recovery via LSI. / Lormans, M; van Deursen, A.

Proceedings of TEFSE'05, the 3rd International workshop on traceability in emerging forms of software engineering. ed. / s.n.New York (NY), USA : Association for Computing Machinery (ACM), 2005. p. 1-6.

Research output: Scientific - peer-reviewConference contribution

Harvard

Lormans, M & van Deursen, A 2005, Reconstructing requirements coverage views from design and test using traceability recovery via LSI. in s.n. (ed.), Proceedings of TEFSE'05, the 3rd International workshop on traceability in emerging forms of software engineering. Association for Computing Machinery (ACM), New York (NY), USA, pp. 1-6, TEFSE'05, 3rd International Workshop on Traceability in Emerging Forms of Software Engineering; ong Beach (CA), USA, 8-8 November.

APA

Lormans, M., & van Deursen, A. (2005). Reconstructing requirements coverage views from design and test using traceability recovery via LSI. In s.n. (Ed.), Proceedings of TEFSE'05, the 3rd International workshop on traceability in emerging forms of software engineering. (pp. 1-6). New York (NY), USA: Association for Computing Machinery (ACM).

Vancouver

Lormans M, van Deursen A. Reconstructing requirements coverage views from design and test using traceability recovery via LSI. In s.n., editor, Proceedings of TEFSE'05, the 3rd International workshop on traceability in emerging forms of software engineering. New York (NY), USA: Association for Computing Machinery (ACM). 2005. p. 1-6.

Author

Lormans, M; van Deursen, A / Reconstructing requirements coverage views from design and test using traceability recovery via LSI.

Proceedings of TEFSE'05, the 3rd International workshop on traceability in emerging forms of software engineering. ed. / s.n.New York (NY), USA : Association for Computing Machinery (ACM), 2005. p. 1-6.

Research output: Scientific - peer-reviewConference contribution

BibTeX

@inbook{098d67a3105d4ba994c222747254c3c7,
title = "Reconstructing requirements coverage views from design and test using traceability recovery via LSI",
keywords = "conference contrib. refereed, Conf.proc. > 3 pag",
author = "M Lormans and {van Deursen}, A",
note = "Editors & ISBN onbekend, WPM",
year = "2005",
publisher = "Association for Computing Machinery (ACM)",
pages = "1--6",
editor = "s.n.",
booktitle = "Proceedings of TEFSE'05, the 3rd International workshop on traceability in emerging forms of software engineering",
address = "United States",

}

RIS

TY - CHAP

T1 - Reconstructing requirements coverage views from design and test using traceability recovery via LSI

AU - Lormans,M

AU - van Deursen,A

N1 - Editors & ISBN onbekend, WPM

PY - 2005

Y1 - 2005

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

UR - http://homepages.cwi.nl/~arie/papers/lsi/tefse05.pdf

M3 - Conference contribution

SP - 1

EP - 6

BT - Proceedings of TEFSE'05, the 3rd International workshop on traceability in emerging forms of software engineering

PB - Association for Computing Machinery (ACM)

ER -

ID: 2077556