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Reliability and Lifetime Assessment of Optical Materials in LED-Based Products. / Yazdan Mehr, Maryam; van Driel, Willem; Zhang, Guo Qi.

Solid State Lighting Reliability Part 2: Components to Systems. ed. / Willem Dirk van Driel; Xuejun Fan; Guo Qi Zhang. 1. ed. Cham : Springer, 2018. p. 115-139 (Solid State Lighting Technology and Application Series; Vol. 3).

Research output: Chapter in Book/Conference proceedings/Edited volumeChapterScientificpeer-review

Harvard

Yazdan Mehr, M, van Driel, W & Zhang, GQ 2018, Reliability and Lifetime Assessment of Optical Materials in LED-Based Products. in WD van Driel, X Fan & GQ Zhang (eds), Solid State Lighting Reliability Part 2: Components to Systems. 1 edn, Solid State Lighting Technology and Application Series, vol. 3, Springer, Cham, pp. 115-139. https://doi.org/10.1007/978-3-319-58175-0_5

APA

Yazdan Mehr, M., van Driel, W., & Zhang, G. Q. (2018). Reliability and Lifetime Assessment of Optical Materials in LED-Based Products. In W. D. van Driel, X. Fan, & G. Q. Zhang (Eds.), Solid State Lighting Reliability Part 2: Components to Systems (1 ed., pp. 115-139). (Solid State Lighting Technology and Application Series; Vol. 3). Springer. https://doi.org/10.1007/978-3-319-58175-0_5

Vancouver

Yazdan Mehr M, van Driel W, Zhang GQ. Reliability and Lifetime Assessment of Optical Materials in LED-Based Products. In van Driel WD, Fan X, Zhang GQ, editors, Solid State Lighting Reliability Part 2: Components to Systems. 1 ed. Cham: Springer. 2018. p. 115-139. (Solid State Lighting Technology and Application Series). https://doi.org/10.1007/978-3-319-58175-0_5

Author

Yazdan Mehr, Maryam ; van Driel, Willem ; Zhang, Guo Qi. / Reliability and Lifetime Assessment of Optical Materials in LED-Based Products. Solid State Lighting Reliability Part 2: Components to Systems. editor / Willem Dirk van Driel ; Xuejun Fan ; Guo Qi Zhang. 1. ed. Cham : Springer, 2018. pp. 115-139 (Solid State Lighting Technology and Application Series).

BibTeX

@inbook{e81d3d9b3a8f4e3289207bc0c04d6b54,
title = "Reliability and Lifetime Assessment of Optical Materials in LED-Based Products",
abstract = "Lumen depreciation is one of the major failure modes in light-emitting diode (LED) systems. It originates from the degradation of the different components within the system, including the chip, the driver, and the optical materials (i.e., phosphorous layer). The kinetics of degradation in real-life applications is relatively slow, and in most cases, it takes several years to see an obvious deterioration of optical properties. A highly accelerated stress testing (HAST) setup and a methodology to extrapolate the results to real applications are therefore needed to test the reliability of LED package and lens materials. Employing HAST concept in LED industry is inevitable due to the necessity of assessing the reliability of new products in a short period of time. This chapter aims at briefly explaining the degradation mechanism of optical components in LED package and how they contribute to the lumen depreciation of the LED package. The concept of HAST and the way the reliability of LED packages can be assessed will also be explained.",
keywords = "Encapsulants, Yellowing, Blue light exposure, Oxidation, Stress testing",
author = "{Yazdan Mehr}, Maryam and {van Driel}, Willem and Zhang, {Guo Qi}",
year = "2018",
doi = "10.1007/978-3-319-58175-0_5",
language = "English",
isbn = "978-3-319-58174-3",
series = "Solid State Lighting Technology and Application Series",
publisher = "Springer",
pages = "115--139",
editor = "{van Driel}, {Willem Dirk} and Xuejun Fan and Zhang, {Guo Qi}",
booktitle = "Solid State Lighting Reliability Part 2",
edition = "1",

}

RIS

TY - CHAP

T1 - Reliability and Lifetime Assessment of Optical Materials in LED-Based Products

AU - Yazdan Mehr, Maryam

AU - van Driel, Willem

AU - Zhang, Guo Qi

PY - 2018

Y1 - 2018

N2 - Lumen depreciation is one of the major failure modes in light-emitting diode (LED) systems. It originates from the degradation of the different components within the system, including the chip, the driver, and the optical materials (i.e., phosphorous layer). The kinetics of degradation in real-life applications is relatively slow, and in most cases, it takes several years to see an obvious deterioration of optical properties. A highly accelerated stress testing (HAST) setup and a methodology to extrapolate the results to real applications are therefore needed to test the reliability of LED package and lens materials. Employing HAST concept in LED industry is inevitable due to the necessity of assessing the reliability of new products in a short period of time. This chapter aims at briefly explaining the degradation mechanism of optical components in LED package and how they contribute to the lumen depreciation of the LED package. The concept of HAST and the way the reliability of LED packages can be assessed will also be explained.

AB - Lumen depreciation is one of the major failure modes in light-emitting diode (LED) systems. It originates from the degradation of the different components within the system, including the chip, the driver, and the optical materials (i.e., phosphorous layer). The kinetics of degradation in real-life applications is relatively slow, and in most cases, it takes several years to see an obvious deterioration of optical properties. A highly accelerated stress testing (HAST) setup and a methodology to extrapolate the results to real applications are therefore needed to test the reliability of LED package and lens materials. Employing HAST concept in LED industry is inevitable due to the necessity of assessing the reliability of new products in a short period of time. This chapter aims at briefly explaining the degradation mechanism of optical components in LED package and how they contribute to the lumen depreciation of the LED package. The concept of HAST and the way the reliability of LED packages can be assessed will also be explained.

KW - Encapsulants

KW - Yellowing

KW - Blue light exposure

KW - Oxidation

KW - Stress testing

U2 - 10.1007/978-3-319-58175-0_5

DO - 10.1007/978-3-319-58175-0_5

M3 - Chapter

SN - 978-3-319-58174-3

T3 - Solid State Lighting Technology and Application Series

SP - 115

EP - 139

BT - Solid State Lighting Reliability Part 2

A2 - van Driel, Willem Dirk

A2 - Fan, Xuejun

A2 - Zhang, Guo Qi

PB - Springer

CY - Cham

ER -

ID: 31671791