Abstract
A methodology, based on accelerated degradation testing, is developed to predict the lifetime of remote phosphor plates used in solid-state lighting (SSL) applications. Both thermal stress and light intensity are used to accelerate degradation reaction in remote phosphor plates. A reliability model, based on the Eyring relationship, is also developed in which both acceleration factors (light intensity and temperature) are incorporated. Results show that the developed methodology leads to a significant decay of the luminous flux, correlated colour temperature (CCT) and chromatic properties of phosphor plates within a practically reasonable period of time. The combination of developed acceleration testing and a generalized Eyring equation-based reliability model is a very promising methodology which can be applied in the SSL industry.
Original language | English |
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Pages (from-to) | 444-452 |
Number of pages | 9 |
Journal | Journal of Electronic Materials |
Volume | 45 |
Issue number | 1 |
DOIs | |
Publication status | Published - 5 Nov 2015 |
Keywords
- LED
- remote phosphor
- light intensity
- thermal ageing