Report on electromigration- and stress migration properties of AlSi VPd alloys

JP Lokker, AJ Kalkman, AH Verbruggen, GCAM Janssen, S Kordic, RA Augur, AG Dirks, RAM Wolters

Research output: Book/Report › Report › Professional

Original language	Undefined/Unknown
Place of Publication	Delft
Publisher	Technische Universiteit Delft
Number of pages	5
Publication status	Published - 1996

Name
Publisher	Technische Universiteit Delft

Cite this

TY - BOOK

T1 - Report on electromigration- and stress migration properties of AlSi VPd alloys

AU - Lokker, JP

AU - Kalkman, AJ

AU - Verbruggen, AH

AU - Janssen, GCAM

AU - Kordic, S

AU - Augur, RA

AU - Dirks, AG

AU - Wolters, RAM

PY - 1996

Y1 - 1996

M3 - Report

BT - Report on electromigration- and stress migration properties of AlSi VPd alloys

PB - Technische Universiteit Delft

CY - Delft

ER -