Scale-adaptive landmark detection, classification and size estimation in 3D object-background images.

G de Vries, PW Verbeek

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

    2 Citations (Scopus)
    Original languageUndefined/Unknown
    Title of host publicationICPR15, Proc. 15th Int. Conference on Pattern Recognition
    EditorsA Sanfeliu, JJ Villanueva, M Vanrell, R Alquezar, AK Jain, J Kittler
    Place of PublicationLos Alamitos
    PublisherIEEE
    Pages1026-1029
    Number of pages4
    ISBN (Print)0-7695-0750-6
    Publication statusPublished - 2000
    EventBarcelona, Spain - Los Alamitos
    Duration: 3 Sept 20007 Sept 2000

    Publication series

    Name
    PublisherIEEE Computer Society Press
    NameInternational Conference on Pattern Recognition
    Volume3
    ISSN (Print)1051-4651

    Conference

    ConferenceBarcelona, Spain
    Period3/09/007/09/00

    Bibliographical note

    ISSN: 1051-4651

    Keywords

    • ZX Int.klas.verslagjaar < 2002

    Cite this