Scan more with memory scan test

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

4 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	4th IEEE international conference on design & technology of integrated systems in nanoscale era
Editors	s.n.
Place of Publication	Piscataway
Publisher	IEEE Society
Pages	204-209
Number of pages	6
ISBN (Print)	978-1-4244-4321-5
Publication status	Published - 2009
Event	DTIS'09 - Piscataway Duration: 6 Apr 2009 → 7 Apr 2009

Name
Publisher	IEEE

Conference	DTIS'09
Period	6/04/09 → 7/04/09

Keywords

@inproceedings{194c7ceb58884d2dabbc473a117a5775,

title = "Scan more with memory scan test",

keywords = "conference contrib. refereed, Conf.proc. > 3 pag",

author = "S Hamdioui and Z Al-Ars",

year = "2009",

language = "Undefined/Unknown",

isbn = "978-1-4244-4321-5",

publisher = "IEEE Society",

pages = "204--209",

editor = "s.n.",

booktitle = "4th IEEE international conference on design & technology of integrated systems in nanoscale era",

note = "DTIS'09 ; Conference date: 06-04-2009 Through 07-04-2009",

}

TY - GEN

T1 - Scan more with memory scan test

AU - Hamdioui, S

AU - Al-Ars, Z

PY - 2009

Y1 - 2009

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 978-1-4244-4321-5

SP - 204

EP - 209

BT - 4th IEEE international conference on design & technology of integrated systems in nanoscale era

A2 - s.n., null

PB - IEEE Society

CY - Piscataway

T2 - DTIS'09

Y2 - 6 April 2009 through 7 April 2009

ER -