Abstract
Semiconductors are indispensable in modern grids employing HVDC connections. With their growing use the forensic techniques for conventional grids and components are increasingly applied to semiconductor devices as well. A review of techniques is provided with special attention to the use of distributions and to life cycle bath-tub models (especially for mixed populations). Next, a method for determining the similarity between distributions is presented.
Original language | English |
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Title of host publication | 2018 15th China International Forum on Solid State Lighting: International Forum on Wide Bandgap Semiconductors China (SSLChina: IFWS) |
Publisher | IEEE |
Pages | 164-168 |
Number of pages | 5 |
DOIs | |
Publication status | Published - Oct 2018 |
Event | 15th China International Forum on Solid State Lighting: International Forum on Wide Bandgap Semiconductors China (SSLChina: IFWS) - Shenzhen, China Duration: 23 Oct 2018 → 25 Oct 2018 Conference number: 15 |
Conference
Conference | 15th China International Forum on Solid State Lighting: International Forum on Wide Bandgap Semiconductors China (SSLChina: IFWS) |
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Country/Territory | China |
City | Shenzhen |
Period | 23/10/18 → 25/10/18 |