Soft faults and the importance of stresses in memory testing

Z Al-Ars, AJ van de Goor

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

Original language	Undefined/Unknown
Title of host publication	Design, automation and test in Europe; Date04 Proceedings
Editors	G Gielen, J Figueras
Place of Publication	Piscataway
Publisher	IEEE Society
Pages	1084-1091
Number of pages	8
ISBN (Print)	0-7695-2085-5
Publication status	Published - 2004
Event	DATE'04, Paris, France - Piscataway Duration: 16 Feb 2004 → 20 Apr 2004

Name
Publisher	IEEE

Name
Volume	1

Conference	DATE'04, Paris, France
Period	16/02/04 → 20/04/04

Keywords

@inproceedings{068e43ef5dfc4405af38afbb5565fe2c,

title = "Soft faults and the importance of stresses in memory testing",

keywords = "conference contrib. refereed, Conf.proc. > 3 pag",

author = "Z Al-Ars and {van de Goor}, AJ",

year = "2004",

language = "Undefined/Unknown",

isbn = "0-7695-2085-5",

publisher = "IEEE Society",

pages = "1084--1091",

editor = "G Gielen and J Figueras",

booktitle = "Design, automation and test in Europe; Date04 Proceedings",

note = "DATE'04, Paris, France ; Conference date: 16-02-2004 Through 20-04-2004",

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TY - GEN

T1 - Soft faults and the importance of stresses in memory testing

AU - Al-Ars, Z

AU - van de Goor, AJ

PY - 2004

Y1 - 2004

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 0-7695-2085-5

SP - 1084

EP - 1091

BT - Design, automation and test in Europe; Date04 Proceedings

A2 - Gielen, G

A2 - Figueras, J

PB - IEEE Society

CY - Piscataway

T2 - DATE'04, Paris, France

Y2 - 16 February 2004 through 20 April 2004

ER -