Standard

Software metrics: Pitfalls and best practices. / Bouwers, EM; van Deursen, A; Visser, J.

Proceedings 35th International Conference on Software Engineering. ed. / D Notkin; BHC Cheng; K Pohl. Piscataway, NJ, USA : IEEE Society, 2013. p. 1491-1492.

Research output: Scientific - peer-reviewConference contribution

Harvard

Bouwers, EM, van Deursen, A & Visser, J 2013, Software metrics: Pitfalls and best practices. in D Notkin, BHC Cheng & K Pohl (eds), Proceedings 35th International Conference on Software Engineering. IEEE Society, Piscataway, NJ, USA, pp. 1491-1492, ICSE 2013, San Francisco, CA, USA, 18-26 May. DOI: 10.1109/ICSE.2013.6606755

APA

Bouwers, E. M., van Deursen, A., & Visser, J. (2013). Software metrics: Pitfalls and best practices. In D. Notkin, B. H. C. Cheng, & K. Pohl (Eds.), Proceedings 35th International Conference on Software Engineering. (pp. 1491-1492). Piscataway, NJ, USA: IEEE Society. DOI: 10.1109/ICSE.2013.6606755

Vancouver

Bouwers EM, van Deursen A, Visser J. Software metrics: Pitfalls and best practices. In Notkin D, Cheng BHC, Pohl K, editors, Proceedings 35th International Conference on Software Engineering. Piscataway, NJ, USA: IEEE Society. 2013. p. 1491-1492. Available from, DOI: 10.1109/ICSE.2013.6606755

Author

Bouwers, EM; van Deursen, A; Visser, J / Software metrics: Pitfalls and best practices.

Proceedings 35th International Conference on Software Engineering. ed. / D Notkin; BHC Cheng; K Pohl. Piscataway, NJ, USA : IEEE Society, 2013. p. 1491-1492.

Research output: Scientific - peer-reviewConference contribution

BibTeX

@inbook{aa2e49dbb5704f97a8a330d179c5dc5a,
title = "Software metrics: Pitfalls and best practices",
author = "EM Bouwers and {van Deursen}, A and J Visser",
note = "Harvest Summary of a tutorial",
year = "2013",
doi = "10.1109/ICSE.2013.6606755",
isbn = "978-1-4673-3073-2",
publisher = "IEEE Society",
pages = "1491--1492",
editor = "D Notkin and BHC Cheng and K Pohl",
booktitle = "Proceedings 35th International Conference on Software Engineering",

}

RIS

TY - CHAP

T1 - Software metrics: Pitfalls and best practices

AU - Bouwers,EM

AU - van Deursen,A

AU - Visser,J

N1 - Harvest Summary of a tutorial

PY - 2013

Y1 - 2013

U2 - 10.1109/ICSE.2013.6606755

DO - 10.1109/ICSE.2013.6606755

M3 - Conference contribution

SN - 978-1-4673-3073-2

SP - 1491

EP - 1492

BT - Proceedings 35th International Conference on Software Engineering

PB - IEEE Society

ER -

ID: 3507498