Subsurface damage measurements as tool for proces monitoring.

RM Bijl, OW Fähnle, H van Brug

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

Original languageUndefined/Unknown
Title of host publicationThe fourteenth ASPE annual meeting.
EditorsIrving F Stowers
PublisherASPE
Pages606-609
Number of pages4
ISBN (Print)1-887706-22-4
Publication statusPublished - 1999

Publication series

Name
PublisherASPE
Name
Volume20

Cite this