Synthesized pulsed bias for device characterization

AK Manjanna; K Buisman; M Spirito; M Marchetti; M J Pelk; LCN de Vreede

doi:10.1109/ARFTG.2013.6579031

Synthesized pulsed bias for device characterization

AK Manjanna, K Buisman, M Spirito, M Marchetti, M J Pelk, LCN de Vreede

Electronics

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	English
Title of host publication	Proceedings - 81st ARFTG Microwave Measurement Conference: Metrology for High Speed Circuits and Systems, ARFTG 2013
Editors	L Hayden, B Grossman, D Blackham, J Gering
Place of Publication	Piscataway, NJ, USA
Publisher	IEEE Society
Pages	1-4
Number of pages	4
ISBN (Print)	978-146734982-6
DOIs	https://doi.org/10.1109/ARFTG.2013.6579031
Publication status	Published - 2013
Event	ARFTG 2013, Seattle, WA, USA - Piscataway, NJ, USA Duration: 7 Jun 2013 → 7 Jun 2013

Publication series

Name
Publisher	IEEE

Conference

Conference	ARFTG 2013, Seattle, WA, USA
Period	7/06/13 → 7/06/13

Bibliographical note

Harvest
Article number: 6579031

Access to Document

10.1109/ARFTG.2013.6579031

Cite this

Manjanna, AK., Buisman, K., Spirito, M., Marchetti, M., Pelk, M. J., & de Vreede, LCN. (2013). Synthesized pulsed bias for device characterization. In L. Hayden, B. Grossman, D. Blackham, & J. Gering (Eds.), Proceedings - 81st ARFTG Microwave Measurement Conference: Metrology for High Speed Circuits and Systems, ARFTG 2013 (pp. 1-4). IEEE Society. https://doi.org/10.1109/ARFTG.2013.6579031

@inproceedings{0c68a2926bf34e25a421eb2c6c8eb1be,

title = "Synthesized pulsed bias for device characterization",

author = "AK Manjanna and K Buisman and M Spirito and M Marchetti and Pelk, {M J} and {de Vreede}, LCN",

note = "Harvest Article number: 6579031; ARFTG 2013, Seattle, WA, USA ; Conference date: 07-06-2013 Through 07-06-2013",

year = "2013",

doi = "10.1109/ARFTG.2013.6579031",

language = "English",

isbn = "978-146734982-6",

publisher = "IEEE Society",

pages = "1--4",

editor = "L Hayden and B Grossman and D Blackham and J Gering",

booktitle = "Proceedings - 81st ARFTG Microwave Measurement Conference: Metrology for High Speed Circuits and Systems, ARFTG 2013",

}

Manjanna, AK, Buisman, K, Spirito, M, Marchetti, M, Pelk, MJ & de Vreede, LCN 2013, Synthesized pulsed bias for device characterization. in L Hayden, B Grossman, D Blackham & J Gering (eds), Proceedings - 81st ARFTG Microwave Measurement Conference: Metrology for High Speed Circuits and Systems, ARFTG 2013. IEEE Society, Piscataway, NJ, USA, pp. 1-4, ARFTG 2013, Seattle, WA, USA, 7/06/13. https://doi.org/10.1109/ARFTG.2013.6579031

Synthesized pulsed bias for device characterization. / Manjanna, AK; Buisman, K; Spirito, M et al.
Proceedings - 81st ARFTG Microwave Measurement Conference: Metrology for High Speed Circuits and Systems, ARFTG 2013. ed. / L Hayden; B Grossman; D Blackham; J Gering. Piscataway, NJ, USA: IEEE Society, 2013. p. 1-4.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Synthesized pulsed bias for device characterization

AU - Manjanna, AK

AU - Buisman, K

AU - Spirito, M

AU - Marchetti, M

AU - Pelk, M J

AU - de Vreede, LCN

N1 - Harvest Article number: 6579031

PY - 2013

Y1 - 2013

U2 - 10.1109/ARFTG.2013.6579031

DO - 10.1109/ARFTG.2013.6579031

M3 - Conference contribution

SN - 978-146734982-6

SP - 1

EP - 4

BT - Proceedings - 81st ARFTG Microwave Measurement Conference: Metrology for High Speed Circuits and Systems, ARFTG 2013

A2 - Hayden, L

A2 - Grossman, B

A2 - Blackham, D

A2 - Gering, J

PB - IEEE Society

CY - Piscataway, NJ, USA

T2 - ARFTG 2013, Seattle, WA, USA

Y2 - 7 June 2013 through 7 June 2013

ER -

Manjanna AK, Buisman K, Spirito M, Marchetti M, Pelk MJ , de Vreede LCN. Synthesized pulsed bias for device characterization. In Hayden L, Grossman B, Blackham D, Gering J, editors, Proceedings - 81st ARFTG Microwave Measurement Conference: Metrology for High Speed Circuits and Systems, ARFTG 2013. Piscataway, NJ, USA: IEEE Society. 2013. p. 1-4 doi: 10.1109/ARFTG.2013.6579031