Systematic memory test generation for DRAM defects causing two floating nodes

Z Al-Ars, AJ van de Goor

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Original languageUndefined/Unknown
Title of host publicationMTDT 2003; Records of the 2003 international workshop on memory technology, design and testing
Editors s.n.
Place of PublicationPiscataway
PublisherIEEE Society
Pages27-32
Number of pages6
ISBN (Print)0-7695-2004-9
Publication statusPublished - 2003
Event2003 international workshop on memory technology, design and testing, San Jose, California - Piscataway
Duration: 28 Jul 200329 Jul 2003

Publication series

Name
PublisherIEEE

Conference

Conference2003 international workshop on memory technology, design and testing, San Jose, California
Period28/07/0329/07/03

Keywords

  • Conf.proc. > 3 pag

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