@inproceedings{1819441220c54176a657e72393a87f33,
title = "Systematic memory test generation for DRAM defects causing two floating nodes",
keywords = "Conf.proc. > 3 pag",
author = "Z Al-Ars and {van de Goor}, AJ",
year = "2003",
language = "Undefined/Unknown",
isbn = "0-7695-2004-9",
publisher = "IEEE Society",
pages = "27--32",
editor = "s.n.",
booktitle = "MTDT 2003; Records of the 2003 international workshop on memory technology, design and testing",
note = "2003 international workshop on memory technology, design and testing, San Jose, California ; Conference date: 28-07-2003 Through 29-07-2003",
}