Technological challenges in defect detection for metal strip; pattern recognition algorithms

PP Jonker, RPW Duin, D de Ridder, R Ligteringen, DMJ Tax

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

    Original languageUndefined/Unknown
    Title of host publicationThe 1st Sino-European Symposium on Quality Control of High-Grade Steel
    EditorsG Qing, S Kaiser
    Place of PublicationBeijing
    PublisherUniversity of Science and Technology Beijing
    Pages38-40
    Number of pages3
    ISBN (Print)geen
    Publication statusPublished - 1999

    Publication series

    Name
    PublisherUniversity of Science and Technology Beijing

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