@inproceedings{dd83e3ecca324119aff7f5032a578dca,
title = "Technological challenges in defect detection for metal strip; pattern recognition algorithms",
author = "PP Jonker and RPW Duin and {de Ridder}, D and R Ligteringen and DMJ Tax",
year = "1999",
language = "Undefined/Unknown",
isbn = "geen",
publisher = "University of Science and Technology Beijing",
pages = "38--40",
editor = "G Qing and S Kaiser",
booktitle = "The 1st Sino-European Symposium on Quality Control of High-Grade Steel",
address = "China",
}