Technology for nanoelectronic devises based on ultra-high vacuum scanning tunneling microscopy on the Si(100) surface.

G Palasantzas, B Ilge, S Rogge, LJ Geerligs

    Research output: Contribution to journalArticleScientificpeer-review

    8 Citations (Scopus)
    Original languageUndefined/Unknown
    Pages (from-to)133-136
    Number of pages4
    JournalMicroelectronic Engineering
    Volume46
    Issue number1-4
    Publication statusPublished - 1999

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