Test point insertion that facilitates ATPG in reducing test time and data volume

MJ Geuzebroek, JT van Linden, AJ van de Goor

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

49 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	Proceedings International Test Conference 2002
Place of Publication	Piscataway, NJ, USA
Publisher	IEEE Society
Pages	138-148
Number of pages	11
ISBN (Print)	0-7803-7542-4
Publication status	Published - 2002
Event	International Test Conference 2002 - Piscataway, NJ, USA Duration: 8 Oct 2002 → 10 Oct 2002

Name
Publisher	IEEE

Conference	International Test Conference 2002
Period	8/10/02 → 10/10/02

Keywords

@inproceedings{89ff3d76b930482eaabb9fb416c1bef8,

title = "Test point insertion that facilitates ATPG in reducing test time and data volume",

keywords = "Elektrotechniek, Techniek, ZX Nader te bep. ivm conversie, ZX Int.klas.verslagjaar < 2002",

author = "MJ Geuzebroek and {van Linden}, JT and {van de Goor}, AJ",

year = "2002",

language = "Undefined/Unknown",

isbn = "0-7803-7542-4",

publisher = "IEEE Society",

pages = "138--148",

booktitle = "Proceedings International Test Conference 2002",

note = "International Test Conference 2002 ; Conference date: 08-10-2002 Through 10-10-2002",

}

TY - GEN

T1 - Test point insertion that facilitates ATPG in reducing test time and data volume

AU - Geuzebroek, MJ

AU - van Linden, JT

AU - van de Goor, AJ

PY - 2002

Y1 - 2002

KW - Elektrotechniek

KW - Techniek

KW - ZX Nader te bep. ivm conversie

KW - ZX Int.klas.verslagjaar < 2002

M3 - Conference contribution

SN - 0-7803-7542-4

SP - 138

EP - 148

BT - Proceedings International Test Conference 2002

PB - IEEE Society

CY - Piscataway, NJ, USA

T2 - International Test Conference 2002

Y2 - 8 October 2002 through 10 October 2002

ER -