Testing (embedded) memories: new fault models, test, DfT, BIST, BISR, and industrial results

AJ van de Goor

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Professional

Original language	Undefined/Unknown
Title of host publication	ETW 2003; Eighth IEEE European test workshop
Place of Publication	Piscataway
Publisher	IEEE Society
Pages	1-1
Number of pages	1
ISBN (Print)	0-7695-1908-3
Publication status	Published - 2003
Event	Eighth IEEE European test workshop, Maastricht, The Netherlands - Piscataway Duration: 25 May 2003 → 28 May 2003

Name
Publisher	IEEE

Conference	Eighth IEEE European test workshop, Maastricht, The Netherlands
Period	25/05/03 → 28/05/03

Keywords

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title = "Testing (embedded) memories: new fault models, test, DfT, BIST, BISR, and industrial results",

keywords = "Geen BTA classificatie",

author = "{van de Goor}, AJ",

year = "2003",

language = "Undefined/Unknown",

isbn = "0-7695-1908-3",

publisher = "IEEE Society",

pages = "1--1",

booktitle = "ETW 2003; Eighth IEEE European test workshop",

note = "Eighth IEEE European test workshop, Maastricht, The Netherlands ; Conference date: 25-05-2003 Through 28-05-2003",

}

TY - GEN

T1 - Testing (embedded) memories: new fault models, test, DfT, BIST, BISR, and industrial results

AU - van de Goor, AJ

PY - 2003

Y1 - 2003

KW - Geen BTA classificatie

M3 - Conference contribution

SN - 0-7695-1908-3

SP - 1

EP - 1

BT - ETW 2003; Eighth IEEE European test workshop

PB - IEEE Society

CY - Piscataway

T2 - Eighth IEEE European test workshop, Maastricht, The Netherlands

Y2 - 25 May 2003 through 28 May 2003

ER -