Tests for address decoder delay faults in RAMs due to inter-gate opens

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

3 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	Proceedings of the 9th IEEE European Test Symposium
Place of Publication	Los Alamitos
Publisher	IEEE
Pages	146-153
Number of pages	8
ISBN (Print)	0-7695-2119-3
Publication status	Published - 2004
Event	9th IEEE European Test Symposium, Ajaccio, France - Los Alamitos Duration: 23 May 2004 → 26 May 2004

Name
Publisher	IEEE Computer Society

Conference	9th IEEE European Test Symposium, Ajaccio, France
Period	23/05/04 → 26/05/04

ed. is niet bekend

Keywords

@inproceedings{dd06d5b51a2d4deaa31d53223b2a9028,

title = "Tests for address decoder delay faults in RAMs due to inter-gate opens",

keywords = "conference contrib. refereed, Conf.proc. > 3 pag",

author = "{van de Goor}, AJ and S Hamdioui and Z Al-Ars",

note = "ed. is niet bekend; 9th IEEE European Test Symposium, Ajaccio, France ; Conference date: 23-05-2004 Through 26-05-2004",

year = "2004",

language = "Undefined/Unknown",

isbn = "0-7695-2119-3",

publisher = "IEEE",

pages = "146--153",

booktitle = "Proceedings of the 9th IEEE European Test Symposium",

address = "United States",

}

TY - GEN

T1 - Tests for address decoder delay faults in RAMs due to inter-gate opens

AU - van de Goor, AJ

AU - Hamdioui, S

AU - Al-Ars, Z

N1 - ed. is niet bekend

PY - 2004

Y1 - 2004

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 0-7695-2119-3

SP - 146

EP - 153

BT - Proceedings of the 9th IEEE European Test Symposium

PB - IEEE

CY - Los Alamitos

T2 - 9th IEEE European Test Symposium, Ajaccio, France

Y2 - 23 May 2004 through 26 May 2004

ER -