@inproceedings{6f08444464eb4779af80998ca3b75668,
title = "The effect of interface models on the interface stresses between a thin oxide layer and a substrate",
keywords = "Conf.proc. > 3 pag",
author = "YT He and GQ Zhang and LJ Ernst",
year = "2002",
language = "Undefined/Unknown",
isbn = "0-7803-9819-X",
publisher = "Institute of Electrical and Electronic Engineers (IEEE)",
pages = "213--219",
editor = "LJ Ernst and GQ Zhang and R Dudek and {de Saint Leger}, O",
booktitle = "3rd international conference on benefiting from thermal and mechanical simulation in (micro)electronics",
note = "EuroSimE 2002 ; Conference date: 15-04-2002 Through 17-04-2002",
}