The HΓ-VNA, an Interferometric Approach for the Accurate Measurement of Extreme Impedances

Raffaele Romano; Faisal Mubarak; Marco Spirito; Luca Galatro

doi:10.1109/ARFTG.2019.8739232

The HΓ-VNA, an Interferometric Approach for the Accurate Measurement of Extreme Impedances

Raffaele Romano, Faisal Mubarak, Marco Spirito, Luca Galatro

Electronics

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

5 Citations (Scopus)

Abstract

In this contribution, we present the performances of an IQ mixer-based RF-interferometer module, called the HΓ-VNA, designed to be used as an add-on to VNAs to improve the measurement sensitivity and accuracy of DUTs presenting extreme impedances (|Γ|>0.8). The calibration procedure used to obtain accuracy improvement is presented, and allows to set both reference and system impedance to any selected one. The procedure is benchmarked by comparing it to a conventional 50 Ω short-open-load calibration performed on a 50-Ohm VNA. For this purpose, a custom on-wafer calibration kit has been realized, using a fused silica substrate, featuring calibration loads with very high impedances (between 3.5 kΩ and 7 kΩ). Experimental results show accuracy improvements when applying the proposed calibration technique to the measurement of high impedance resistors, for frequencies below 4 GHz.

Original language	English
Title of host publication	2019 93rd ARFTG Microwave Measurement Conference
Subtitle of host publication	Measurement Challenges for the Upcoming RF and mm-Wave Communications and Sensing Systems, ARFTG 2019
Publisher	IEEE
Pages	1-6
Number of pages	6
ISBN (Electronic)	978-1-7281-0506-2
ISBN (Print)	978-1-7281-0507-9
DOIs	https://doi.org/10.1109/ARFTG.2019.8739232
Publication status	Published - 1 Jun 2019
Event	93rd ARFTG Microwave Measurement Conference, ARFTG 2019 - Boston, United States Duration: 7 Jun 2019 → 7 Jun 2019

Conference

Conference	93rd ARFTG Microwave Measurement Conference, ARFTG 2019
Country/Territory	United States
City	Boston
Period	7/06/19 → 7/06/19

Keywords

extreme impedance
high gamma
interferometer
IQ mixer
vector network analyzer

Access to Document

10.1109/ARFTG.2019.8739232

Cite this

Romano, R., Mubarak, F., Spirito, M., & Galatro, L. (2019). The HΓ-VNA, an Interferometric Approach for the Accurate Measurement of Extreme Impedances. In 2019 93rd ARFTG Microwave Measurement Conference: Measurement Challenges for the Upcoming RF and mm-Wave Communications and Sensing Systems, ARFTG 2019 (pp. 1-6). Article 8739232 IEEE. https://doi.org/10.1109/ARFTG.2019.8739232

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title = "The HΓ-VNA, an Interferometric Approach for the Accurate Measurement of Extreme Impedances",

abstract = "In this contribution, we present the performances of an IQ mixer-based RF-interferometer module, called the HΓ-VNA, designed to be used as an add-on to VNAs to improve the measurement sensitivity and accuracy of DUTs presenting extreme impedances (|Γ|>0.8). The calibration procedure used to obtain accuracy improvement is presented, and allows to set both reference and system impedance to any selected one. The procedure is benchmarked by comparing it to a conventional 50 Ω short-open-load calibration performed on a 50-Ohm VNA. For this purpose, a custom on-wafer calibration kit has been realized, using a fused silica substrate, featuring calibration loads with very high impedances (between 3.5 kΩ and 7 kΩ). Experimental results show accuracy improvements when applying the proposed calibration technique to the measurement of high impedance resistors, for frequencies below 4 GHz.",

keywords = "extreme impedance, high gamma, interferometer, IQ mixer, vector network analyzer",

author = "Raffaele Romano and Faisal Mubarak and Marco Spirito and Luca Galatro",

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Romano, R , Mubarak, F , Spirito, M & Galatro, L 2019, The HΓ-VNA, an Interferometric Approach for the Accurate Measurement of Extreme Impedances. in 2019 93rd ARFTG Microwave Measurement Conference: Measurement Challenges for the Upcoming RF and mm-Wave Communications and Sensing Systems, ARFTG 2019., 8739232, IEEE, pp. 1-6, 93rd ARFTG Microwave Measurement Conference, ARFTG 2019, Boston, United States, 7/06/19. https://doi.org/10.1109/ARFTG.2019.8739232

The HΓ-VNA, an Interferometric Approach for the Accurate Measurement of Extreme Impedances. / Romano, Raffaele ; Mubarak, Faisal ; Spirito, Marco et al.
2019 93rd ARFTG Microwave Measurement Conference: Measurement Challenges for the Upcoming RF and mm-Wave Communications and Sensing Systems, ARFTG 2019. IEEE, 2019. p. 1-6 8739232.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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PY - 2019/6/1

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N2 - In this contribution, we present the performances of an IQ mixer-based RF-interferometer module, called the HΓ-VNA, designed to be used as an add-on to VNAs to improve the measurement sensitivity and accuracy of DUTs presenting extreme impedances (|Γ|>0.8). The calibration procedure used to obtain accuracy improvement is presented, and allows to set both reference and system impedance to any selected one. The procedure is benchmarked by comparing it to a conventional 50 Ω short-open-load calibration performed on a 50-Ohm VNA. For this purpose, a custom on-wafer calibration kit has been realized, using a fused silica substrate, featuring calibration loads with very high impedances (between 3.5 kΩ and 7 kΩ). Experimental results show accuracy improvements when applying the proposed calibration technique to the measurement of high impedance resistors, for frequencies below 4 GHz.

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The HΓ-VNA, an Interferometric Approach for the Accurate Measurement of Extreme Impedances

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Keywords

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