Documents

  • 8928291

    Accepted author manuscript, 180 KB, PDF-document

DOI

Micro-clones are tiny duplicated pieces of code, they typically comprise only a few statements or lines. In this paper, we expose the "last line effect," the phenomenon that the last line or statement in a micro-clone is much more likely to contain an error than the previous lines or statements. We do this by analyzing 208 open source projects and reporting on 202 faulty micro-clones.

Original languageEnglish
Title of host publicationProceedings - 2015 IEEE 23rd International Conference on Program Comprehension, ICPC 2015
PublisherIEEE Computer Society
Pages240-243
Number of pages4
Volume2015-August
ISBN (Electronic)978-14673-8159-8
DOIs
StatePublished - 2015
Event23rd IEEE International Conference on Program Comprehension, ICPC 2015 - Florence, Italy
Duration: 18 May 201519 May 2015

Conference

Conference23rd IEEE International Conference on Program Comprehension, ICPC 2015
CountryItaly
CityFlorence
Period18/05/1519/05/15

    Research areas

  • Code Clones, Defects, Last Line Effect, Last Statement Effect, Micro-clone

ID: 8928291