The state-of-art future trends in testing embedded memories

S Hamdioui; GN Gaydadjiev; AJ van de Goor

The state-of-art future trends in testing embedded memories

S Hamdioui, GN Gaydadjiev, AJ van de Goor

Computer Engineering

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

52 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	Records of the 2004 International workshop on Memory Technology, Design and Testing MTDT 2004
Editors	FM Titsworth
Place of Publication	Piscataway
Publisher	IEEE
Pages	54-59
Number of pages	6
ISBN (Print)	0-7695-2193-2
Publication status	Published - 2004
Event	2004 International workshop on Memory Technology, Design and Technology, San Jose, USA - Piscataway Duration: 9 Aug 2004 → 10 Aug 2004

Publication series

Name
Publisher	IEEE Computer Society

Conference

Conference	2004 International workshop on Memory Technology, Design and Technology, San Jose, USA
Period	9/08/04 → 10/08/04

Keywords

Elektrotechniek
Techniek
conference contrib. refereed
Conf.proc. > 3 pag

Cite this

@inproceedings{99078ef756204072bcae89315f36c8e4,

title = "The state-of-art future trends in testing embedded memories",

keywords = "Elektrotechniek, Techniek, conference contrib. refereed, Conf.proc. > 3 pag",

author = "S Hamdioui and GN Gaydadjiev and {van de Goor}, AJ",

year = "2004",

language = "Undefined/Unknown",

isbn = "0-7695-2193-2",

publisher = "IEEE",

pages = "54--59",

editor = "FM Titsworth",

booktitle = "Records of the 2004 International workshop on Memory Technology, Design and Testing MTDT 2004",

address = "United States",

note = "2004 International workshop on Memory Technology, Design and Technology, San Jose, USA ; Conference date: 09-08-2004 Through 10-08-2004",

}

The state-of-art future trends in testing embedded memories. / Hamdioui, S ; Gaydadjiev, GN; van de Goor, AJ.
Records of the 2004 International workshop on Memory Technology, Design and Testing MTDT 2004. ed. / FM Titsworth. Piscataway: IEEE, 2004. p. 54-59.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - The state-of-art future trends in testing embedded memories

AU - Hamdioui, S

AU - Gaydadjiev, GN

AU - van de Goor, AJ

PY - 2004

Y1 - 2004

KW - Elektrotechniek

KW - Techniek

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 0-7695-2193-2

SP - 54

EP - 59

BT - Records of the 2004 International workshop on Memory Technology, Design and Testing MTDT 2004

A2 - Titsworth, FM

PB - IEEE

CY - Piscataway

T2 - 2004 International workshop on Memory Technology, Design and Technology, San Jose, USA

Y2 - 9 August 2004 through 10 August 2004

ER -