@inproceedings{253f5c461ba74ad79288119e13d63ed8,
title = "TPI for improving PR fault coverage of Boolean and three-state circuits",
keywords = "Elektrotechniek, Techniek, Conf.proc. > 3 pag",
author = "MJ Geuzebroek and {van de Goor}, AJ",
year = "2003",
language = "Undefined/Unknown",
isbn = "0-7695-1908-3",
publisher = "IEEE Society",
pages = "3--8",
editor = "s.n.",
booktitle = "ETW 2003; Eighth IEEE European test workshop",
note = "Eighth IEEE European test workshop, Maastricht, The Netherlands ; Conference date: 25-05-2003 Through 28-05-2003",
}