Abstract
Uniform or near-uniform generation of solutions for large satisfiability formulas is a problem of theoretical and practical interest for the testing community. Recent works proposed two algorithms (namely UniGen and QuickSampler) for reaching a good compromise between execution time and uniformity guarantees, with empirical evidence on SAT benchmarks. In the context of highly-configurable software systems (e.g., Linux), it is unclear whether UniGen and QuickSampler can scale and sample uniform software configurations. In this paper, we perform a thorough experiment on 128 real-world feature models. We find that UniGen is unable to produce SAT solutions out of such feature models. Furthermore, we show that QuickSampler does not generate uniform samples and that some features are either never part of the sample or too frequently present. Finally, using a case study, we characterize the impacts of these results on the ability to find bugs in a configurable system. Overall, our results suggest that we are not there: more research is needed to explore the cost-effectiveness of uniform sampling when testing large configurable systems.
Original language | English |
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Title of host publication | Proceedings - 2019 IEEE 12th International Conference on Software Testing, Verification and Validation, ICST 2019 |
Subtitle of host publication | Proceedings |
Editors | L. O'Conner |
Place of Publication | Piscataway, NJ |
Publisher | IEEE |
Pages | 240-251 |
Number of pages | 12 |
ISBN (Electronic) | 9781728117355 |
ISBN (Print) | 978-1-7281-1737-9 |
DOIs | |
Publication status | Published - 2019 |
Event | ICST 2019 : 2019 IEEE 12th International Conference on Software Testing, Verification and Validation - Xi'an, China Duration: 22 Apr 2019 → 27 Apr 2019 Conference number: 12th |
Conference
Conference | ICST 2019 |
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Country/Territory | China |
City | Xi'an |
Period | 22/04/19 → 27/04/19 |
Bibliographical note
Accepted author manuscriptKeywords
- Configurable-systems
- SAT
- Software-product-lines
- Software-testing
- Uniform-sampling
- Variability-modeling