@inproceedings{a6f47f485090446da0dccb3133895b22,
title = "Using a CISC microcontroller to test embedded memories",
keywords = "conference contrib. refereed, Conf.proc. > 3 pag",
author = "{van de Goor}, AJ and S Hamdioui and GN Gaydadjiev",
year = "2010",
language = "English",
isbn = "978-1-4244-6613-9",
publisher = "IEEE Society",
pages = "382--387",
editor = "s.n.",
booktitle = "IEEE intl. symposium on design and diagnostics of electronic circuits and systems",
note = "DDECS 2010 ; Conference date: 14-04-2010 Through 16-04-2010",
}