Using a CISC microcontroller to test embedded memories

AJ van de Goor, S Hamdioui, GN Gaydadjiev

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

10 Citations (Scopus)
Original languageEnglish
Title of host publicationIEEE intl. symposium on design and diagnostics of electronic circuits and systems
Editors s.n.
Place of PublicationPiscataway
PublisherIEEE Society
Pages382-387
Number of pages6
ISBN (Print)978-1-4244-6613-9
Publication statusPublished - 2010
EventDDECS 2010 - Piscataway
Duration: 14 Apr 201016 Apr 2010

Publication series

Name
PublisherIEEE

Conference

ConferenceDDECS 2010
Period14/04/1016/04/10

Keywords

  • conference contrib. refereed
  • Conf.proc. > 3 pag

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