Standard

Visual Patterns in Issue Tracking Data. / Knab, P; Pinzger, M; Gall, HC.

New Modeling Concepts for Today¿s Software Processes. ed. / J Muench; Y Yang; W Schaefer. Berlin : Springer, 2010. p. 222-233.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Harvard

Knab, P, Pinzger, M & Gall, HC 2010, Visual Patterns in Issue Tracking Data. in J Muench, Y Yang & W Schaefer (eds), New Modeling Concepts for Today¿s Software Processes. Springer, Berlin, pp. 222-233, International Conference on New Modeling Concepts for Today's Software Processes (ICSP 2010), 8/07/10.

APA

Knab, P., Pinzger, M., & Gall, HC. (2010). Visual Patterns in Issue Tracking Data. In J. Muench, Y. Yang, & W. Schaefer (Eds.), New Modeling Concepts for Today¿s Software Processes (pp. 222-233). Springer.

Vancouver

Knab P, Pinzger M, Gall HC. Visual Patterns in Issue Tracking Data. In Muench J, Yang Y, Schaefer W, editors, New Modeling Concepts for Today¿s Software Processes. Berlin: Springer. 2010. p. 222-233

Author

Knab, P ; Pinzger, M ; Gall, HC. / Visual Patterns in Issue Tracking Data. New Modeling Concepts for Today¿s Software Processes. editor / J Muench ; Y Yang ; W Schaefer. Berlin : Springer, 2010. pp. 222-233

BibTeX

@inproceedings{c103e895dc55448fb826089e9b66da5f,
title = "Visual Patterns in Issue Tracking Data",
keywords = "CWTS JFIS < 0.75",
author = "P Knab and M Pinzger and HC Gall",
year = "2010",
language = "English",
isbn = "978-3-642-14346-5",
publisher = "Springer",
pages = "222--233",
editor = "J Muench and Y Yang and W Schaefer",
booktitle = "New Modeling Concepts for Today¿s Software Processes",
note = "International Conference on New Modeling Concepts for Today's Software Processes (ICSP 2010) ; Conference date: 08-07-2010 Through 09-07-2010",

}

RIS

TY - GEN

T1 - Visual Patterns in Issue Tracking Data

AU - Knab, P

AU - Pinzger, M

AU - Gall, HC

PY - 2010

Y1 - 2010

KW - CWTS JFIS < 0.75

UR - http://swerl.tudelft.nl/twiki/pub/Main/TechnicalReports/TUD-SERG-2010-016.pdf

M3 - Conference contribution

SN - 978-3-642-14346-5

SP - 222

EP - 233

BT - New Modeling Concepts for Today¿s Software Processes

A2 - Muench, J

A2 - Yang, Y

A2 - Schaefer, W

PB - Springer

CY - Berlin

T2 - International Conference on New Modeling Concepts for Today's Software Processes (ICSP 2010)

Y2 - 8 July 2010 through 9 July 2010

ER -

ID: 3755267