@inproceedings{e34bd218c21b4441806f9b3c30eb4559,
title = "Worst-case bit line coupling backgrounds for open defects in SRAM cells",
keywords = "conference contrib. refereed, Conf.proc. > 3 pag",
author = "IS Irobi and Z Al-Ars",
year = "2009",
language = "Undefined/Unknown",
isbn = "978-90-73461-62-8",
publisher = "STW",
pages = "25--30",
editor = "s.n.",
booktitle = "20th annual workshop on circuits, systems and signal processing",
note = "ProRISC 2009 ; Conference date: 26-11-2009 Through 27-11-2009",
}