X-ray spectroscopy measurements with multi-anode saw tooth silicon drift detector

J Sonsky; J Huizenga; CWE van Eijk; PM Sarro

X-ray spectroscopy measurements with multi-anode saw tooth silicon drift detector

J Sonsky, J Huizenga, CWE van Eijk, PM Sarro

Electronic Components, Technology and Materials

Research output: Chapter in Book/Conference proceedings/Edited volume › Chapter › Scientific

Original language	Undefined/Unknown
Title of host publication	Book of abstracts of the 5th International Conference on Position-Sensitive Detectors, University College London, September 13-17, 1999, United Kingdom
Pages	24-24
Publication status	Published - 1999

Keywords

ZX Int.klas.verslagjaar < 2002

Cite this

@inbook{282a62b53659474a82811126caf3dc1f,

title = "X-ray spectroscopy measurements with multi-anode saw tooth silicon drift detector",

keywords = "ZX Int.klas.verslagjaar < 2002",

author = "J Sonsky and J Huizenga and {van Eijk}, CWE and PM Sarro",

year = "1999",

language = "Undefined/Unknown",

pages = "24--24",

booktitle = "Book of abstracts of the 5th International Conference on Position-Sensitive Detectors, University College London, September 13-17, 1999, United Kingdom",

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X-ray spectroscopy measurements with multi-anode saw tooth silicon drift detector. / Sonsky, J; Huizenga, J ; van Eijk, CWE et al.
Book of abstracts of the 5th International Conference on Position-Sensitive Detectors, University College London, September 13-17, 1999, United Kingdom. 1999. p. 24-24.

Research output: Chapter in Book/Conference proceedings/Edited volume › Chapter › Scientific

TY - CHAP

T1 - X-ray spectroscopy measurements with multi-anode saw tooth silicon drift detector

AU - Sonsky, J

AU - Huizenga, J

AU - van Eijk, CWE

AU - Sarro, PM

PY - 1999

Y1 - 1999

KW - ZX Int.klas.verslagjaar < 2002

M3 - Chapter

SP - 24

EP - 24

BT - Book of abstracts of the 5th International Conference on Position-Sensitive Detectors, University College London, September 13-17, 1999, United Kingdom

ER -