Yield and cost analysis or 3D stacked ICs

Research output: Thesis › Dissertation (TU Delft)

Original language	English
Qualification	Doctor of Philosophy
Awarding Institution	Delft University of Technology
Supervisors/Advisors	Bertels, Koen, Supervisor
Award date	5 Sept 2014
Print ISBNs	978-94-6186-331-7
DOIs	https://doi.org/10.4233/uuid:23d05dce-da6a-4291-9a6f-002a679f85ff
Publication status	Published - 2014

Embargo tot 5-9-2015

Access to Document

@phdthesis{5679e3581df24940a472053ecb61d6b7,

title = "Yield and cost analysis or 3D stacked ICs",

author = "M Taouil",

note = "Embargo tot 5-9-2015",

year = "2014",

doi = "10.4233/uuid:23d05dce-da6a-4291-9a6f-002a679f85ff",

language = "English",

isbn = "978-94-6186-331-7",

type = "Dissertation (TU Delft)",

school = "Delft University of Technology",

}