DOI

Original languageEnglish
Title of host publication20th IEEE Asian Test Symposium 2011
EditorsA Chatterjee, A Patra, S Kundu, S Ravi
Place of PublicationPiscataway, NJ, USA
PublisherIEEE Society
Pages480-485
Number of pages6
ISBN (Print)978-0-7695-4583-7
DOIs
Publication statusPublished - 2011
EventATS 2011 - Piscataway, NJ, USA
Duration: 20 Nov 201123 Nov 2011

Publication series

Name
PublisherIEEE

Conference

ConferenceATS 2011
Period20/11/1123/11/11

ID: 2286649