Zero-performance-overhead online fault detection and diagnosis in 3D stacked integrated circuits

S Safiruddin; M Lefter; DV Borodin; GR Voicu; SD Cotofana

Zero-performance-overhead online fault detection and diagnosis in 3D stacked integrated circuits

S Safiruddin, M Lefter, DV Borodin, GR Voicu, SD Cotofana

Computer Engineering

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

2 Citations (Scopus)

Original language	English
Title of host publication	ACM International symposium on nanoscale architectures
Editors	s.n.
Place of Publication	New York
Publisher	IEEE Society
Pages	1-8
Number of pages	8
Publication status	Published - 2012
Event	NANOARCH 2012 - New York Duration: 4 Jul 2012 → 6 Jul 2012

Publication series

Name
Publisher	IEEE

Conference

Conference	NANOARCH 2012
Period	4/07/12 → 6/07/12

Cite this

@inproceedings{a857ffae6a74447682ed9aa0bcdbebf0,

title = "Zero-performance-overhead online fault detection and diagnosis in 3D stacked integrated circuits",

author = "S Safiruddin and M Lefter and DV Borodin and GR Voicu and SD Cotofana",

year = "2012",

language = "English",

publisher = "IEEE Society",

pages = "1--8",

editor = "s.n.",

booktitle = "ACM International symposium on nanoscale architectures",

note = "NANOARCH 2012 ; Conference date: 04-07-2012 Through 06-07-2012",

}

Zero-performance-overhead online fault detection and diagnosis in 3D stacked integrated circuits. / Safiruddin, S; Lefter, M; Borodin, DV et al.
ACM International symposium on nanoscale architectures. ed. / s.n. New York: IEEE Society, 2012. p. 1-8.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Zero-performance-overhead online fault detection and diagnosis in 3D stacked integrated circuits

AU - Safiruddin, S

AU - Lefter, M

AU - Borodin, DV

AU - Voicu, GR

AU - Cotofana, SD

PY - 2012

Y1 - 2012

UR - http://ce-publications.et.tudelft.nl/publications/1308_zeroperformanceoverhead_online_fault_detection_and_diagno.pdf

M3 - Conference contribution

SP - 1

EP - 8

BT - ACM International symposium on nanoscale architectures

A2 - s.n., null

PB - IEEE Society

CY - New York

T2 - NANOARCH 2012

Y2 - 4 July 2012 through 6 July 2012

ER -

Zero-performance-overhead online fault detection and diagnosis in 3D stacked integrated circuits

Publication series

Conference

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Cite this